Magnetooptic ellipsometry in multilayers at arbitrary magnetization
نویسندگان
چکیده
منابع مشابه
on Characterization of metal / dielectric multilayers with in - situ ellipsometry
The project was completed on 31 December 2010. In this project, we did simulations for metal/dielectric multilayer structures, their applications as hyperlens for sub-wavelength imaging with resolution beyond diffraction limit, optimized metal (silver) films and started fabrication and characterization of dielectric films with in-situ ellipsometry monitoring the thickness and optical constants....
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We investigated by means of an automated ellipsometer the adsorption of prothrombin from a buffer solution by multilayers of 14:0/14:0- and 18:1/18:1-phosphatidylserine (PS) stacked on chromium slides. In this instrument thickness and refractive index of the adsorbed phospholipid and proteins are monitored continuously. Two equations are derived to relate the mass of stacked phospholipids and t...
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ژورنال
عنوان ژورنال: Optics Express
سال: 2001
ISSN: 1094-4087
DOI: 10.1364/oe.9.000121